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SN74LVTH18646APM
+StücklisteIC SCAN-TEST-DEV/XCVR 64-LQFP
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HerstellerTexas Instruments
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Herstellerteil #SN74LVTH18646APM
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Paket 64-LQFP
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Auf Lager3587
365 Tage Qualitätsgarantie
7*24 Stunden-Servicegarantie
90-Tage Kundendienstgarantie
Originalproduktgarantie
Spezifikationen
| Attribut | Wert |
| Supplier | Texas Instruments |
| Package | Tray |
| Series | 74LVTH |
| ProductStatus | Active |
| LogicType | ABT Scan Test Device With Transceivers and Registers |
| SupplyVoltage | 2.7V ~ 3.6V |
| NumberofBits | 18 |
| OperatingTemperature | -40°C ~ 85°C |
| MountingType | Surface Mount |
| Package/Case | 64-LQFP |
Übersicht
Description
Equivalent
Pinout
Function: Octal bidirectional buffer/driver (8-bit transceiver) with 3-state outputs. It connects two 8-bit buses (A0–A7 and B0–B7); direction is controlled by DIR and outputs are enabled/disabled by OE (tri-state).
Manufacturer
- What kind of company: A multinational American semiconductor company that designs and manufactures analog and digital integrated circuits.
Application
- 16-bit bidirectional bus buffering and isolation between microprocessors/memory and peripherals (3-state outputs to prevent bus contention).
- Memory and I/O bus interfacing, buffering data/address lines in embedded systems.
- Backplane/inter-board data paths and bus expansion in consumer, automotive, and telecom equipment.
- Mixed-voltage/bus interfacing (level shifting between different logic families) where fast, low-power 3-state drivers are needed.
Note: It is a high-speed, low-voltage, tri-state bus transceiver/driver suitable for any application requiring a buffered, controllable data bus.